Korean J. Met. Mater.
2022;60(2):149-159. Published online 2022 Jan 12
Conductive atomic force microscopy (C-AFM) is one of the most commonly used characterization techniques for piezoelectric one-dimensional nanomaterials. However, a comprehensive understanding of the effects of certain scan parameters on the C-AFM signals remains elusive. In the present work, the dependency of C-AFM signals on the normal force, scan speed,..... More